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arXiv 1808.04286cs.AR
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D-RaNGe:使用商品DRAM设备生成低延迟和高吞吐量的真随机数

D-RaNGe: Using Commodity DRAM Devices to Generate True Random Numbers with Low Latency and High Throughput

Jeremie S. Kim, Minesh Patel, Hasan Hassan, Lois Orosa, Onur Mutlu

摘要:

我们提出了一种新的DRAM为基础的真随机数发生器(TRNG),利用DRAM单元作为熵源。其关键思想是故意违反DRAM访问时序参数,并使用由此产生的错误作为随机性的来源。我们的技术专门降低DRAM行激活延迟(时序参数tRCD)低于DRAM推荐的规格,诱导读取错误,或激活失败,表现出真正的随机行为。然后,我们聚合来自多个小区的结果数据,以获得能够以低延迟提供高吞吐量的随机数的TRNG。为了证明我们的TRNG设计使用商品DRAM芯片是可行的,我们严格描述了来自三家主要DRAM制造商的282个最先进的LPDDR 4器件的激活故障行为。我们使用来自相同制造商的四个额外的DDR3 DRAM设备来验证我们的观察结果。我们的研究结果表明,每个设备中的许多单元产生随机数据,这些数据在时间和温度变化中保持稳健。我们使用我们的观察开发D-RanGe,一种方法,用于从商品DRAM设备中提取真正的随机数,具有高吞吐量和低延迟,故意违反读访问定时参数。我们使用常用的NIST随机性统计测试套件来评估我们的TRNG的质量,并发现D-RaNGe:1)成功通过每个测试,2)生成真正的随机数,吞吐量比以前最高吞吐量的基于DRAM的TRNG高出两个数量级。

英文摘要:

We propose a new DRAM-based true random number generator (TRNG) that leverages DRAM cells as an entropy source. The key idea is to intentionally violate the DRAM access timing parameters and use the resulting errors as the source of randomness. Our technique specifically decreases the DRAM row activation latency (timing parameter tRCD) below manufacturer-recommended specifications, to induce read errors, or activation failures, that exhibit true random behavior. We then aggregate the resulting data from multiple cells to obtain a TRNG capable of providing a high throughput of random numbers at low latency. To demonstrate that our TRNG design is viable using commodity DRAM chips, we rigorously characterize the behavior of activation failures in 282 state-of-the-art LPDDR4 devices from three major DRAM manufacturers. We verify our observations using four additional DDR3 DRAM devices from the same manufacturers. Our results show that many cells in each device produce random data that remains robust over both time and temperature variation. We use our observations to develop D-RanGe, a methodology for extracting true random numbers from commodity DRAM devices with high throughput and low latency by deliberately violating the read access timing parameters. We evaluate the quality of our TRNG using the commonly-used NIST statistical test suite for randomness and find that D-RaNGe: 1) successfully passes each test, and 2) generates true random numbers with over two orders of magnitude higher throughput than the previous highest-throughput DRAM-based TRNG.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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