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arXiv 1804.01604cond-mat.mtrl-sci
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超高真空沉积高锰硅化物Mn4Si7薄膜

Ultra-high Vacuum Deposition of Higher Manganese Silicide Mn4Si7 Thin Films

Rajendra P Dulal, Bishnu R Dahal, Ian L Pegg, John Philip

摘要:

我们采用超高真空沉积技术,在基压为1 × 10 ~(-9)Pa的Si(100)衬底上成功地生长了Mn_4Si_7薄膜。膜的厚度从65-100 nm变化。这些薄膜表现出的四方晶体结构和顺磁行为的化学计量Mn 4Si 7系统的预测。它们在室温下的电阻率为3.321 x 10-5 ohm-m,并显示出半金属性质。

英文摘要:

We have successfully grown one of the higher manganese silicides, Mn4Si7 thin films on silicon (100) substrates using an ultra-high vacuum deposition with a base pressure of 1x10-9 torr. The thickness of the film was varied from 65-100 nm. These films exhibit a tetragonal crystal structure and display paramagnetic behavior as predicted for the stoichiometric Mn4Si7 system. They have a resistivity of 3.321 x 10-5 ohm-m at room temperature and show a semi-metallic nature.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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