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arXiv 1709.00451cond-mat.mes-hallcond-mat.mtrl-sci
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半导体中电子的热弛豫理论

Theory of Thermal Relaxation of Electrons in Semiconductors

Sridhar Sadasivam, Maria K. Y. Chan, Pierre Darancet

摘要:

我们计算的瞬态动力学的声子接触高能量的“热”载流子在12极性和非极性半导体,使用第一性原理玻尔兹曼输运框架。对于大多数材料,我们发现,在电子温度的衰减偏离显着从一个单指数模型的时间范围从1 ps到15 ps后的电子激发,伴随着非热振动模式的出现的现象。我们证明,这些效应是由于声子子系统内的缓慢热化造成的,这是由这些材料中电子-声子和声子-声子相互作用的时间尺度的巨大不均匀性引起的。我们提出了一个广义的2-温度模型占声子热化作为限制步骤的电子-声子热化,它捕捉到了半导体中的热电子和空穴的全部热弛豫。我们的研究结果的一个直接后果是,对于半导体,关于电子-声子和声子-声子耦合的光谱分布的信息可以从电子温度的多指数行为中提取。

英文摘要:

We compute the transient dynamics of phonons in contact with high energy "hot" charge carriers in 12 polar and non-polar semiconductors, using a first-principles Boltzmann transport framework. For most materials, we find that the decay in electronic temperature departs significantly from a single-exponential model at times ranging from 1 ps to 15 ps after electronic excitation, a phenomenon concomitant with the appearance of non-thermal vibrational modes. We demonstrate that these effects result from the slow thermalization within the phonon subsystem, caused by the large heterogeneity in the timescales of electron-phonon and phonon-phonon interactions in these materials. We propose a generalized 2-temperature model accounting for the phonon thermalization as a limiting step of electron-phonon thermalization, which captures the full thermal relaxation of hot electrons and holes in semiconductors. A direct consequence of our findings is that, for semiconductors, information about the spectral distribution of electron-phonon and phonon-phonon coupling can be extracted from the multi-exponential behavior of the electronic temperature.

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