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arXiv 1705.04076astro-ph.IM
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X-IFU仪器的粒子背景

The particle background of the X-IFU instrument

Simone Lotti, Teresa Mineo, Christian Jacquey, Silvano Molendi, Matteo D'Andrea, Claudio Macculi, Luigi Piro

摘要:

在本文中,我们将回顾ATHENA任务机载X-IFU仪器上预期的粒子背景的最新估计。粒子背景是由两种不同的粒子群引起的:所谓的“软质子”和宇宙射线。第一种成分由低能粒子(<100 keV)组成,这些粒子被反射镜朝向焦平面汇集,在滤光片内损失部分能量,并在仪器灵敏度带内引起背景计数。后一个分量是由高能粒子(> 100 MeV)引起的,这些粒子拥有足够的能量穿过航天器并从任何方向到达探测器,将其能量的一小部分沉积在仪器内。这两个组件估计使用蒙特卡罗模拟和最新的结果在这里。

英文摘要:

In this paper we are going to review the latest estimates for the particle background expected on the X-IFU instrument onboard of the ATHENA mission. The particle background is induced by two different particle populations: the so called "soft protons" and the Cosmic rays. The first component is composed of low energy particles (< 100s keV) that get funnelled by the mirrors towards the focal plane, losing part of their energy inside the filters and inducing background counts inside the instrument sensitivity band. The latter component is induced by high energy particles (> 100 MeV) that possess enough energy to cross the spacecraft and reach the detector from any direction, depositing a small fraction of their energy inside the instrument. Both these components are estimated using Monte Carlo simulations and the latest results are presented here.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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