arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1504.07613physics.opticscond-mat.mtrl-sci
收藏

Optical loss by surface transfer doping in silicon waveguides

Luca Alloatti, Christian Koos, Juerg Leuthold

英文摘要:

We show that undoped silicon waveguides may suffer of up to 1.8 dB/cm free-carrier absorption caused by improper surface passivation. To verify the effects of free-carriers we apply a gate field to the waveguides. Smallest losses correspond to higher electrical sheet resistances and are generally obtained with non-zero gate fields. The presence of free carriers for zero gate field is attributed to surface transfer doping. These results open new perspectives for minimizing propagation losses in silicon waveguides and for obtaining low-loss and highly conductive silicon films without applying a gate voltage.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑