arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1502.07421math.PR
收藏

随机正则图上的接触过程

Contact Processes on Random Regular Graphs

Steven Lalley, Wei Su

摘要:

我们证明了随机$d$ -正则图上由一个感染点引发的接触过程在其超临界阶段服从“截断现象”。特别地,我们证明了当感染率大于无穷$d$ -正则树上接触过程的临界值时,存在依赖于感染率的正常数$C, p$,使得对于足够小的$ε> 0$,当顶点数$n$很大时,则(a)在时间$t< (C - ε) \log n$,感染顶点的分数为零,但是(b)在时间$(C + ε) \log n$,感染顶点的分数在$p$的$ε$内,概率为$p$。

英文摘要:

We show that the contact process on a random $d$-regular graph initiated by a single infected vertex obeys the "cutoff phenomenon" in its supercritical phase. In particular, we prove that when the infection rate is larger than the critical value of the contact process on the infinite $d$-regular tree there are positive constants $C, p$ depending on the infection rate such that for sufficiently small $ε> 0$, when the number $n$ of vertices is large then (a) at times $t< (C - ε) \log n$ the fraction of infected vertices is vanishingly small, but (b) at time $(C + ε) \log n$ the fraction of infected vertices is within $ε$ of $p$, with probability $p$.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑