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arXiv 1408.4569cond-mat.mtrl-scicond-mat.str-el
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氧还原La $_{0.7}$ Ce $_{0.3}$ MnO $_3$薄膜的电输运特性:跳跃能、Mn价态和载流子局域长度的计算

Electrical-transport characteristics of as-grown and oxygen-reduced La$_{0.7}$Ce$_{0.3}$MnO$_3$ films: calculation of hopping energies, Mn valences, and carrier localization lengths

Andreas Thiessen, Elke Beyreuther, Robert Werner, Reinhold Kleiner, Dieter Koelle, Lukas M. Eng

摘要:

目前,铈掺杂的LaMnO $_3$被生动地讨论为电子掺杂的对应原型,以充分建立的空穴掺杂的混合价锰氧化物。在此,比较在SrTiO $_3$单晶衬底上生长的不同厚度、CeO $_3$相分离程度和氧缺乏的La $_{0.7}$ Ce $_{0.3}$ MnO $_3$薄膜的电阻-相对电阻-相对电阻。从300~ 90 K的温度(R vs. T)行为。当薄膜厚度在10~ 100 nm范围内变化时,外延应变对电输运的影响很小,而CeO $_2$团簇的存在和氧的缺乏则完全改变了跳跃机制的类型.这是通过拟合各自的\textit{R-T}曲线与三种不同的传输模型(绝热极化子跳跃,莫特可变范围跳跃,埃夫罗斯-什克洛夫斯基可变范围跳跃),这是常用的混合价锰氧化物。几个特征的输运参数,如跳跃能量,载流子局域化长度,以及Mn价从拟合程序推导出来。

英文摘要:

Presently, cerium-doped LaMnO$_3$ is vividly discussed as an electron-doped counterpart prototype to the well-established hole-doped mixed-valence manganites. Here, La$_{0.7}$Ce$_{0.3}$MnO$_3$ thin films of different thicknesses, degrees of CeO$_2$ phase segregation, and oxygen deficiency, grown on SrTiO$_3$ single crystal substrates, are compared with respect to their resistance-vs.-temperature (R vs. T) behavior from 300~K down to 90~K. While the variation of the film thickness (and thus the degree of epitaxial strain) in the range between 10~nm and 100~nm has only a weak impact on the electrical transport, the degree of oxygen deficiency as well as the existence of CeO$_2$ clusters can completely change the type of hopping mechanism. This is shown by fitting the respective \textit{R-T} curves with three different transport models (adiabatic polaron hopping, Mott variable-range hopping, Efros-Shklovskii variable-range hopping), which are commonly used for the mixed-valence manganites. Several characteristic transport parameters, such as the hopping energies, the carrier localization lengths, as well as the Mn valences are derived from the fitting procedures.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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