arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1402.1852astro-ph.HE
收藏

用Suzaku/XIS获得软X射线扩散背景中的OI荧光线污染

OI Fluorescent Line Contamination in Soft X-Ray Diffuse Background Obtained with Suzaku/XIS

Norio Sekiya, Noriko Y. Yamasaki, Kazuhisa Mitsuda, Yoh Takei

摘要:

OVII谱线强度的定量测量是了解软X射线漫射背景的有力手段。通过对145个高纬朱雀/XIS观测数据中OVII线强度的系统分析,发现XIS光谱中OI荧光线的通量随时间的推移有增加的趋势,特别是在2011年以后。对于这些观察结果,除非考虑OI荧光线污染,否则OVII线强度将被高估。由于OI谱线发射来自太阳X射线,这一增加表明OI荧光能量的入射太阳X射线往往大于朱雀观测的早期阶段(2005 - 2010)。

英文摘要:

The quantitative measurement of OVII line intensity is a powerful method for understanding the soft X-ray diffuse background. By systematically analyzing the OVII line intensity in 145 high-latitude Suzaku/XIS observations, the flux of OI fluorescent line in the XIS spectrum, contaminating the OVII line, is found to have an increasing trend with time especially after 2011. For these observations, the OVII line intensity would be overestimated unless taking into consideration the OI fluorescent line contamination. Since the OI line emission originates from solar X-rays, this increase suggests that incident solar X-rays at the OI fluorescence energy tend to be larger than the early phase of Suzaku observations (2005 - 2010).

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑