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arXiv 1304.7865cond-mat.mtrl-sci
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临界晶粒尺寸和广义流变应力-晶粒尺寸相关性

Critical grain sizes and generalized flow stress - grain size dependence

S. A. Firstov, T. R. Rogul, O. A. Shut

摘要:

在较宽的晶粒尺寸范围内,得到了描述屈服应力与晶粒尺寸关系的广义方程。有两个临界晶粒尺寸对应于强化机制的变化。该方程在d> dcr ~ 1范围内包含霍尔-佩奇关系。对于dcr 1>d> dcr 2,霍尔-佩奇关系中的幂从-1/2变化到-1。在纳米(nm)范围内(d<dcr 2),存在软化(在“弱”边界的情况下)以及显著强化(在“强”边界的情况下)的可能性。

英文摘要:

The generalized eguation that describes the yield stress dependence upon the grain size in the wide range of grain sizes has been obtained. There are two critical grain sizes that corresponds to the changes in strengthening mechanism. The equation includes Hall - Petch relation in the range of d>dcr1. For dcr1>d>dcr2, the power in the Hall - Petch relation varies from -1/2 to -1. In a nanometer (nm) range (d<dcr2) there are posibileties of softerning (in case of "weak" boundaries) as well as significant strengthening (in case of "srtong" boundaries).

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