arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1209.4853cond-mat.supr-con
收藏

用于动态电感检测器的邻近耦合Ti/TiN多层膜

Proximity-Coupled Ti/TiN Multilayers for use in Kinetic Inductance Detectors

Michael R. Vissers, Jiansong Gao, Martin Sandberg, Shannon M. Duff, David S. Wisbey, Kent D. Irwin, David P. Pappas

摘要:

我们在TiN/Ti多层膜中应用超导邻近效应,将临界温度Tc调整到10 mK以内,在75 mm晶片上具有高均匀性(小于15 mK分布)。在0.8 - 2.5K范围内获得了可重复的Tc。这些膜具有高的介电常数,> 100 μ Ohm-cm,并且在GHz范围内谐振器的内部品质因数在100 k和更高的数量级。两个三层的TiN/Ti/TiN和更厚的超晶格薄膜的制备,证明了一个高度控制的过程中的薄膜在很宽的厚度范围。探测器的制造和显示在1550 nm的单光子分辨率。TiN的高均匀性和可控性与高品质因数、动力学电感和惰性相结合,使得这些膜非常适合用于频率复用动力学电感检测器和其他潜在应用,例如纳米线检测器、过渡边缘传感器和相关的量子信息应用。

英文摘要:

We apply the superconducting proximity effect in TiN/Ti multi-layer films to tune the critical temperature, Tc, to within 10 mK with high uniformity (less than 15 mK spread) across a 75 mm wafer. Reproducible Tc's are obtained from 0.8 - 2.5 K. These films had high resistivities, > 100 uOhm-cm and internal quality factors for resonators in the GHz range on the order of 100k and higher. Both trilayers of TiN/Ti/TiN and thicker superlattice films were prepared, demonstrating a highly controlled process for films over a wide thickness range. Detectors were fabricated and showed single photon resolution at 1550 nm. The high uniformity and controllability coupled with the high quality factor, kinetic inductance, and inertness of TiN make these films ideal for use in frequency multiplexed kinetic inductance detectors and other potential applications such as nanowire detectors, transition edge sensors and associated quantum information applications.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑