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arXiv 1111.6280cond-mat.mes-hall
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不存在带电杂质时的电子-空穴熔池

Electron-hole puddles in the absence of charged impurities

Marco Gibertini, Andrea Tomadin, Francisco Guinea, Mikhail I. Katsnelson, Marco Polini

摘要:

人们普遍认为,在基底如石英上的单层石墨烯中的载流子密度不均匀性(“电子-空穴水坑”)是由于靠近石墨烯片的带电杂质。在这里,我们证明了通过使用一个Kohn-Sham-Dirac密度泛函计划,在一个真正的样品中的波纹是足够的,以确定电子空穴水坑的长度尺度大于国家的最先进的扫描隧道显微镜的空间分辨率。

英文摘要:

It is widely believed that carrier-density inhomogeneities ("electron-hole puddles") in single-layer graphene on a substrate like quartz are due to charged impurities located close to the graphene sheet. Here we demonstrate by using a Kohn-Sham-Dirac density-functional scheme that corrugations in a real sample are sufficient to determine electron-hole puddles on length scales that are larger than the spatial resolution of state-of-the-art scanning tunneling microscopy.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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