arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1111.3714cond-mat.mes-hallcond-mat.mtrl-sci
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圆片级石墨烯的红外光谱

Infrared Spectroscopy of Wafer-Scale Graphene

Hugen Yan, Fengnian Xia, Wenjuan Zhu, Marcus Freitag, Christos Dimitrakopoulos, Ageeth A. Bol, George Tulevski, Phaedon Avouris

摘要:

我们报告的光谱结果从中到远红外线的晶圆级石墨烯,外延生长在碳化硅上,或通过化学气相沉积。自由载流子吸收(Drude峰)与通用光学电导率(由于带间跃迁)和由于带填充而发生泡利阻塞的波长同时获得。从这些可以推断石墨烯层数、掺杂水平、薄层电阻率、载流子迁移率和散射率。与剥离的双层石墨烯相比,外延双层石墨烯的中红外吸收在0.37 \pm 0.02 eV处显示出较不明显的峰。在重化学掺杂的单层石墨烯中,在这种原子级薄的材料中测量到由于在250 \mum(40 cm-1)下接近40%的自由载流子而导致的创纪录的高透射率降低,支持石墨烯在远红外和太赫兹光电子学中的巨大潜力。

英文摘要:

We report on spectroscopy results from the mid- to far-infrared on wafer-scale graphene, grown either epitaxially on silicon carbide, or by chemical vapor deposition. The free carrier absorption (Drude peak) is simultaneously obtained with the universal optical conductivity (due to interband transitions), and the wavelength at which Pauli blocking occurs due to band filling. From these the graphene layer number, doping level, sheet resistivity, carrier mobility, and scattering rate can be inferred. The mid-IR absorption of epitaxial two-layer graphene shows a less pronounced peak at 0.37\pm0.02 eV compared to that in exfoliated bilayer graphene. In heavily chemically-doped single layer graphene, a record high transmission reduction due to free carriers approaching 40% at 250 \mum (40 cm-1) is measured in this atomically thin material, supporting the great potential of graphene in far-infrared and terahertz optoelectronics.

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