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arXiv 1104.4149cond-mat.mtrl-sciquant-ph
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GaN/AlN异质结构中极化感生界面电荷的第一性原理计算

First principles calculation of polarization induced interfacial charges in GaN/AlN heterostructures

Rohan Mishra, Oscar D. Restrepo, Siddharth Rajan, Wolfgang Windl

摘要:

提出了一种新的方法来计算半导体异质结构中的极化感生界面电荷,将经典静电学应用于第一性原理计算的实空间能带图,并将其应用于GAN/AlN异质结构中的AlN层(4-6个单层)。我们表明,计算的电场和界面电荷是独立的交换相关泛函(局域密度近似和混合泛函)。我们还发现,计算的界面电荷为(6.8 +/- 0.4)× 10^13 cm-2,与实验结果非常吻合,而6.58 × 10^13 cm-2的值是根据体极化常数计算的,这验证了即使对于非常薄的薄膜,也可以使用体极化常数。

英文摘要:

We propose a new method to calculate polarization induced interfacial charges in semiconductor heterostructures using classical electrostatics applied to real-space band diagrams from first principles calculations and apply it to GaN/AlN heterostructures with ultrathin AlN layers (4-6 monolayers). We show that the calculated electric fields and interfacial charges are independent of the exchange-correlation functionals used (local-density approximation and hybrid functionals). We also find the calculated interfacial charge of (6.8 +/- 0.4) x 10^13 cm-2 to be in excellent agreement with experiments and the value of 6.58 x 10^13 cm-2 calculated from bulk polarization constants, validating the use of bulk constants even for very thin films.

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