arXivDaily arXiv每日学术速递 周一至周五更新
稍安勿躁,官方尚未更新
arXiv 1912.04495cond-mat.mtrl-sci
收藏

Oxygen Incorporation in the MBE growth of ScxGa1-xN and ScxAl1-xN

Joseph Casamento, Huili Grace Xing, Debdeep Jena

英文摘要:

Secondary-ion Mass Spectrometry (SIMS) is used to determine impurity concentrations of carbon and oxygen in two scandium containing nitride semiconductor multilayer heterostructures: ScxGa1-xN/GaN and ScxAl1-xN/AlN grown by molecular beam epitaxy (MBE). In the ScxGa1-xN/GaN heterostructure grown in metal rich conditions on GaN-SiC template substrates with Sc contents up to 28 atomic percent, the oxygen concentration is found to be below 1x1019/cm3, with an increase directly correlated with the Scandium content. In the ScxAl1-xN-AlN heterostructure grown in nitrogen rich conditions on AlN-Al2O3 template substrates with Sc contents up to 26 atomic percent, the oxygen concentration is found to be between 1019 to 1021/cm3, again directly correlated with the Sc content. The increased oxygen and carbon arises during the deposition of scandium alloyed layers.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑