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arXiv 1010.5863cond-mat.mes-hallcond-mat.dis-nn
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氧化铟锡纳米线中长电子退相长度和无序诱导的自旋轨道耦合

Long electron dephasing length and disorder-induced spin-orbit coupling in indium tin oxide nanowires

Yao-Wen Hsu, Shao-Pin Chiu, An-Shao Lien, Juhn-Jong Lin

摘要:

利用四探针组态法测量了两条氧化铟锡(ITO)纳米线在0.25 ~ 40 K温度范围内的量子干涉磁阻效应。与一维弱(反)局域化理论进行比较,提取电子退相长度$L_ϕ$。我们发现,在一个直径为60 nm的纳米线,具有低电阻率的$ρ$(10 K)= 185 $μΩ$ cm,$L_ϕ$是长的,从150 nm在40 K增加到520 nm在0.25 K。因此,纳米线显示出严格的一维弱局域化效应,可达几十开尔文。在具有$ρ$(10 K)= 1030 $μΩ$ cm的高电阻率的72 nm直径的第二纳米线中,退相长度被抑制到$L_ϕ$(0.26 K)= 200 nm,因此在约12 K处发生从1到3的有效器件维度的交叉。特别是在后一种样品中,无序诱导的自旋轨道耦合是明显的,在低于$\sim$ 4 K的温度下表现出弱的反定域效应.这些观察结果表明,通过控制不同水平的原子缺陷和杂质,可以在ITO纳米线中实现多功能的量子干涉效应。

英文摘要:

We have measured the quantum-interference magnetoresistances in two single indium tin oxide (ITO) nanowires between 0.25 and 40 K, by using the four-probe configuration method. The magnetoresistances are compared with the one-dimensional weak-(anti)localization theory to extract the electron dephasing length $L_ϕ$. We found, in a 60-nm diameter nanowire with a low resistivity of $ρ$(10 K) = 185 $μΩ$ cm, that $L_ϕ$ is long, increasing from 150 nm at 40 K to 520 nm at 0.25 K. Therefore, the nanowire reveals strict one-dimensional weak-localization effect up to several tens of degrees of Kelvin. In a second 72-nm diameter nanowire with a high resistivity of $ρ$(10 K) = 1030 $μΩ$ cm, the dephasing length is suppressed to $L_ϕ$(0.26 K) = 200 nm, and thus a crossover of the effective device dimensionality from one to three occurs at about 12 K. In particular, disorder-induced spin-orbit coupling is evident in the latter sample, manifesting weak-antilocalization effect at temperatures below $\sim$ 4 K. These observations demonstrate that versatile quantum-interference effects can be realized in ITO nanowires by controlling differing levels of atomic defects and impurities.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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