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arXiv 1003.4859cond-mat.mtrl-sci
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化学溶液沉积法制备La2Zr2O7薄膜

Deposition of La2Zr2O7 Film by Chemical Solution Deposition

Z. M. Yu, Philippe Odier, S. Morlens, P. Chaudouet, Maria Bacia, L. Zhou, P. X. Zhang, L. H. Jin, C. S. Li, David Philippe, Olivier Fruchart, Y. F. Lu

摘要:

本文研究了用丙酸盐制备La_2Zr_2O_7(LZO)粉体和薄膜的化学溶液沉积(CSD)工艺。处理包括在还原性形成气体(Ar-5%H_2)中的一步循环,以与Ni-5at%W RABIT相容。在这些条件下形成的LZO粉末中发现大量的残余碳(10wt%)。发现Ni-5at%w RABITS上LZO薄膜中立方织构的体积分数是流过样品上方的气体速度的函数。这种现象进行了讨论,在考虑C沉积从含碳气体的前体的热解过程中排放。X射线衍射、电子背散射衍射和RHEED分析表明,在合适的工艺条件下(950 \circC和6.8 \times × 10^{-2} m/s),在Ni-5at%W RABIT上可以获得表面结晶性良好的LZO薄膜。氧化膜中残余碳的存在是CSD工艺在还原条件下沉积的氧化膜普遍存在的问题。

英文摘要:

La2Zr2O7 (LZO) formation of bulk powders and of films by Chemical Solution Deposition (CSD) process have been studied using propionates. The treatment involved a one step cycle in the reducing forming gas (Ar-5%H2) to be compatible with Ni-5at%W RABITS. Large amount of residual carbon was found in LZO powders formed in these conditions (10 wt %). The volume fraction of the cube texture in LZO films on Ni-5at%w RABITS was found to be a function of the speed of the gas flown above sample. This phenomenon is discussed in considering the C deposited from the carbon-containing gases emitted during the pyrolysis of the precursor. Using proper conditions (950 ^\circC and the speed of gas of 6.8\times10^{-2} m/s), LZO films with good surface crystallinity could be obtained on Ni-5at%W RABITS as demonstrated by X-ray diffraction, electron backscattered diffraction and RHEED. The existence of residual carbon in oxide films is a common question to films deposited by CSD processes under reducing condition.

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