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arXiv 1002.2742physics.ins-det
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一种简便的高灵敏度氙气纯度分析技术

A simple high-sensitivity technique for purity analysis of xenon gas

D. S. Leonard, A. Dobi, C. Hall, L. Kaufman, T. Langford, S. Slutsky, Y. R. Yen

摘要:

我们报告的发展和性能的高灵敏度纯度分析技术的气态氙。使用UHV泄漏阀在宏观压力下从感兴趣的系统中对气体进行采样。用液氮冷阱除去样品中存在的氙,用标准真空质谱仪观察剩余的杂质。使用已知杂质水平的氙气校准样品,我们发现N2,O2和甲烷的最低可检测水平分别为1 ppb,160 ppt和60 ppt。与没有冷阱的情况下进行的测量相比,这表示约10,000倍的改进。

英文摘要:

We report on the development and performance of a high-sensitivity purity-analysis technique for gaseous xenon. The gas is sampled at macroscopic pressure from the system of interest using a UHV leak valve. The xenon present in the sample is removed with a liquid-nitrogen cold trap, and the remaining impurities are observed with a standard vacuum mass-spectroscopy device. Using calibrated samples of xenon gas spiked with known levels of impurities, we find that the minimum detectable levels of N2, O2, and methane are 1 ppb, 160 ppt, and 60 ppt respectively. This represents an improvement of about a factor of 10,000 compared to measurements performed without a coldtrap.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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