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arXiv 0912.0978cond-mat.mtrl-sci
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脉冲laser法制备的Mo1-xFexO2(x=0-0.05)薄膜的结构和电磁性能

Structural, electrical and magnetic properties of Mo1-xFexO2 (x=0-0.05) thin films grown by pulsed laser ablation

Ram Prakash, D. M. Phase, R. J. Choudhary, Ravi Kumar

摘要:

我们报道了未掺杂和Fe(2和5原子)的生长。%)掺杂的氧化钼薄膜。X射线衍射结果表明,薄膜为(100)取向,具有以MoO 2相为基础的单斜结构,拉曼光谱也证实了这一点。X射线光电子能谱学表明,Fe以+2价态存在,有利于Fe离子在MoO 2基体中的置换占位。所有薄膜的室温电阻率都很低(约100微欧姆-厘米)。Fe掺杂的样品在室温下表现出铁磁行为。

英文摘要:

We report the growth of undoped and Fe (2 and 5 at. percentage) doped molybdenum oxide thin films on c-plane of sapphire substrate using pulsed laser ablation. X-ray diffraction results show that the films are oriented in (100) direction and have monoclinic structure based on MoO2 phase as also supported by Raman spectroscopy. The x-ray photoelectron spectroscopy reveals chemical state of Fe is +2, which favors the substitutional occupancy of Fe ion in the MoO2 matrix. The room temperature resistivity of all the films are very low (approx.100 microohm-cm). The Fe doped samples show ferromagnetic behavior at room temperature.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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