arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 0905.3277cond-mat.mes-hallcond-mat.mtrl-sci
收藏

硅纳米晶的应变场分析

Analysis of Strain Fields in Silicon Nanocrystals

Dündar E. Yılmaz, Ceyhun Bulutay, Tahir Çağın

摘要:

应变对纳米结构的光学和电学性质有着至关重要的影响。我们计算的原子应变分布在硅纳米晶体的直径为3.2 nm嵌入在无定形二氧化硅矩阵。当应变场用键长与体积应变表示时,出现了一个看似矛盾的图像。两种情况下的应变分布在芯部中表现出均匀的行为,但是在距离表面2-3 μ m的距离内变得不均匀:粘结长度为拉伸,而体积应变为压缩。我们用原子应变分析重新考虑了它们的共存。

英文摘要:

Strain has a crucial effect on the optical and electronic properties of nanostructures. We calculate the atomistic strain distribution in silicon nanocrystals up to a diameter of 3.2 nm embedded in an amorphous silicon dioxide matrix. A seemingly conflicting picture arises when the strain field is expressed in terms of bond lengths versus volumetric strain. The strain profile in either case shows uniform behavior in the core, however it becomes nonuniform within 2-3 Ådistance to the nanocrystal surface: tensile for bond lengths whereas compressive for volumetric strain. We reconsile their coexistence by an atomistic strain analysis.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑