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arXiv 0905.2945cond-mat.mtrl-scicond-mat.str-el
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石墨中载流子浓度的来源

On the origin of the electric carrier concentration in graphite

A. Arndt, D. Spoddig, P. Esquinazi, J. Barzola-Quiquia, T. Butz

摘要:

我们研究了$\sim 60 $ nm厚的单晶石墨样品的电阻率与质子辐照产生的缺陷浓度的关系。我们表明,在室温下,电阻率降低百分之几后,诱导缺陷的浓度低至$\sim 0.1 $ ppm由于载流子密度的增加,与理论估计一致。总体结果表明,在石墨中测量的载流子密度不是本征的,而是与缺陷和杂质有关。

英文摘要:

We investigate the dependence of the electrical resistivity of $\sim 60 $nm thick single crystalline graphite samples on the defect concentration produced by proton irradiation at very low fluences. We show that the resistivity decreases few percent at room temperature after inducing defects at concentrations as low as $\sim 0.1 $ppm due to the increase in the carrier density, in agreement with theoretical estimates. The overall results indicate that the carrier densities measured in graphite are not intrinsic but related to defects and impurities.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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