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arXiv 0904.0933cond-mat.mes-hallcond-mat.supr-con
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磁通量子比特/谐振器系统中实验可实现的C-NOT门

Experimentally Realizable C-NOT Gate in a Flux Qubit/Resonator System

S. Saito, T. Tilma, S. J. Devitt, K. Nemoto, K. Semba

摘要:

在本文中,我们提出了一个实验上可实现的微波脉冲序列,影响控制非(C-NOT)门操作的约瑟夫森结为基础的磁通量子比特/谐振器系统在最终状态高保真。我们在理想条件下获得了两(三)量子位/谐振器系统的0.988(0.980)的C-NOT门过程保真度,以及在目前最佳实验条件下获得的两量子位/谐振器系统的0.903保真度。在这两种情况下,我们发现,“量子位泄漏”到谐振器的更高水平导致了大部分保真度的损失,并且随着退相干效应的增加,这种泄漏变得更加明显。

英文摘要:

In this paper we present an experimentally realizable microwave pulse sequence that effects a Controlled NOT (C-NOT) gate operation on a Josephson junction-based flux-qubit/resonator system with high fidelity in the end state. We obtained a C-NOT gate process fidelity of 0.988 (0.980) for a two (three) qubit/resonator system under ideal conditions, and a fidelity of 0.903 for a two qubit/resonator system under the best, currently achieved, experimental conditions. In both cases, we found that "qubit leakage" to higher levels of the resonator causes a majority of the loss of fidelity, and that such leakage becomes more pronounced as decoherence effects increase.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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