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arXiv 0901.4542cond-mat.mtrl-sci
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掠入射X射线吸收谱研究薄膜中的深度相关局域结构

Depth dependent local structures in thin films unraveled by grazing incidence x-ray absorption spectroscopy

Narcizo M. Souza-Neto, Aline Y. Ramos, Helio C. N. Tolentino, Alessandro Martins, Antonio D. Santos

摘要:

提出了一种利用X射线吸收光谱(XAS)结合掠入射分辨几何方法对薄膜中原子、电子、化学或磁性局域结构进行深度剖析的方法。厚度依赖的光谱特征的定量反卷积进行充分考虑散射和吸收形式主义。测定了纳米FePt薄膜的表面氧化和局部结构深度分布,举例说明了该方法的应用。

英文摘要:

A method of using X-ray absorption spectroscopy (XAS) together with resolved grazing incidence geometry for depth profiling atomic, electronic, chemical or magnetic local structures in thin films is presented. The quantitative deconvolution of thickness-dependent spectral features is performed by fully considering both scattering and absorption formalisms. Surface oxidation and local structural depth profiles in nanometric FePt films are determined, exemplifying the application of the method.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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