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arXiv 0802.0375cond-mat.mes-hall
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Si:P双量子点的偏置光谱和同步SET电荷态探测

Bias spectroscopy and simultaneous SET charge state detection of Si:P double dots

M. Mitic, K. D. Petersson, M. C. Cassidy, R. P. Starrett, E. Gauja, A. J. Ferguson, C. Yang, D. N. Jamieson, R. G. Clark, A. S. Dzurak

摘要:

我们报道了一个由磷离子注入制备的硅双点系统的低温(mK)输运性质的详细研究。所研究的器件由两个掺杂到金属-绝缘体过渡区上方的磷纳米级岛组成,通过名义上未掺杂的(本征)硅隧道势垒彼此分离,并与源极和漏极储层分离。金属控制栅极与Al-AlOx单电子晶体管一起位于衬底表面上,电容耦合到掩埋点。使用源极-漏极偏置光谱结合非侵入性SET电荷感测来探测各个双点电荷状态。在线性(VSD = 0)和非线性(VSD <> 0)状态下测量系统,从而允许计算相关电容。同时使用SET传感和源漏电流测量的检测被证明,提供了一个有价值的组合的系统的分析。使用电荷和电流感测两者观察到三相点随施加偏压的演变。库仑钻石,显示两个点的库仑充电效应之间的相互作用,测量使用同时检测和数值模拟进行比较。

英文摘要:

We report a detailed study of low-temperature (mK) transport properties of a silicon double-dot system fabricated by phosphorous ion implantation. The device under study consists of two phosphorous nanoscale islands doped to above the metal-insulator transition, separated from each other and the source and drain reservoirs by nominally undoped (intrinsic) silicon tunnel barriers. Metallic control gates, together with an Al-AlOx single-electron transistor, were positioned on the substrate surface, capacitively coupled to the buried dots. The individual double-dot charge states were probed using source-drain bias spectroscopy combined with non-invasive SET charge sensing. The system was measured in linear (VSD = 0) and non-linear (VSD <> 0) regimes allowing calculations of the relevant capacitances. Simultaneous detection using both SET sensing and source-drain current measurements was demonstrated, providing a valuable combination for the analysis of the system. Evolution of the triple points with applied bias was observed using both charge and current sensing. Coulomb diamonds, showing the interplay between the Coulomb charging effects of the two dots, were measured using simultaneous detection and compared with numerical simulations.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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