自组装CdTe量子点的电荷泄漏动力学
Dynamics of Charge Leakage From Self-assembled CdTe Quantum Dots
摘要：
我们研究了嵌入场效应结构中的CdTe量子点系综中电荷的泄漏动力学。光激发的电子被存储，并通过适当的偏置脉冲的时间序列读出。我们监测的电子损失的动态，并发现泄漏的速率是强烈依赖于时间，我们归因于光学产生的电场相关的存储电荷。速率方程模型定量再现的结果。
英文摘要：
We study the leakage dynamics of charge stored in an ensemble of CdTe quantum dots embedded in a field-effect structure. Optically excited electrons are stored and read out by a proper time sequence of bias pulses. We monitor the dynamics of electron loss and find that the rate of the leakage is strongly dependent on time, which we attribute to an optically generated electric field related to the stored charge. A rate equation model quantitatively reproduces the results.
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