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arXiv 0705.3879cond-mat.mes-hallcond-mat.mtrl-sci
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Universal characteristics of resonant-tunneling field emission from nanostructured surfaces

S. Johnson, U. Zuelicke, A. Markwitz

英文摘要:

We have performed theoretical and experimental studies of field emission from nanostructured semiconductor cathodes. Resonant tunneling through electric-field-induced interface bound states is found to strongly affect the field-emission characteristics. Our analytical theory predicts power-law and Lorentzian-shaped current-voltage curves for resonant-tunneling field emission from three-dimensional substrates and two-dimensional accumulation layers, respectively. These predicted line shapes are observed in field emission characteristics from self-assembled silicon nanostructures. A simple model describes formation of an accumulation layer and of the resonant level in these systems.

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