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arXiv 0705.1536physics.optics
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用于跟踪780 nm附近空气Refractive Index变化的折射仪

Refractometer for Tracking Changes in the Refractive Index of Air Near 780 nm

N. -E. Khélifa, H. Fang, J. Xu, P. Juncar, M. Himbert

摘要:

本文介绍了一种由双通道法布里-珀罗标准具和发射波长约为780 nm的激光二极管组成的测量空气折射率的新系统。该折射计的原理是基于光学激光源之间的频率测量。它允许准瞬时测量的分辨率优于和范围内的不确定性。文中给出了系统稳定性和用该装置测量空气折射率的初步结果。空气在780 nm处的折射率的首次测量结果在实验不确定度的量级内,与所谓的修正的Edlén方程的预测值一致。据我们所知,这一结果是第一次将修正的Edlén方程的有效性推广到近红外,该方程是在350- 650 nm波长范围内导出的。

英文摘要:

A new system, consisting of a double channel Fabry Perot etalon and laser diodes emitting around 780 nm is described and proposed to be used for air refractive index measurements. The principle of this refractometer is based on frequency measurements between optical laser sources. It permits quasi-instantaneous measurement with a resolution better than and uncertainty in the range. Some preliminary results on the stability of this system and the measurements of the refractive index of air with this apparatus are presented. The first measurements of the index of air at 780 nm are, within an experimental uncertainty of the order of, in agreement with the predicted values by the so-called revised Edlén equations. This result is to the best of our knowledge the first to extend to the near infra-red the validity of the revised Edlén equation derived for the wavelength range 350- 650 nm.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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