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arXiv 0704.0336cond-mat.mes-hall
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声子维数对电子能量弛豫的影响

Influence of Phonon dimensionality on Electron Energy Relaxation

J. T. Karvonen, I. J. Maasilta

摘要:

我们实验研究了声子维数的作用,电子-声子(e-p)相互作用的薄铜线蒸发悬浮氮化硅膜或散装基板上,在亚开尔文温度。利用灵敏的常规金属-绝缘体-超导体(NIS)隧道结温度计测量了电子向声子发射的功率。使用30 nm至750 nm范围内的膜厚度来清楚地看到二维(2D)声子系统效应的开始。我们观察到的第一次,一个二维声子谱清楚地改变的温度依赖性和强度的电子-p散射速率,与相互作用变得更强,在最低温度低于$\sim$ 0.5 K的30 nm膜。

英文摘要:

We studied experimentally the role of phonon dimensionality on electron-phonon (e-p) interaction in thin copper wires evaporated either on suspended silicon nitride membranes or on bulk substrates, at sub-Kelvin temperatures. The power emitted from electrons to phonons was measured using sensitive normal metal-insulator-superconductor (NIS) tunnel junction thermometers. Membrane thicknesses ranging from 30 nm to 750 nm were used to clearly see the onset of the effects of two-dimensional (2D) phonon system. We observed for the first time that a 2D phonon spectrum clearly changes the temperature dependence and strength of the e-p scattering rate, with the interaction becoming stronger at the lowest temperatures below $\sim$ 0.5 K for the 30 nm membranes.

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