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arXiv 2605.27139eess.IVcs.CVphysics.ins-det

无监督深度图像先验用于稀疏视角和有限角度电子断层扫描

Unsupervised Deep Image Prior for Sparse-View and Limited-Angle Electron Tomography

Univ. Grenoble Alpes, CEA, Leti(格勒诺布尔阿尔卑斯大学,CEA,LETI);Univ. Grenoble Alpes, CEA, Liten(格勒诺布尔阿尔卑斯大学,CEA,Liten);CEA, Joliot, NeuroSpin(CEA,Joliot,NeuroSpin);Inria, MIND, Université Paris-Saclay(Inria,MIND,巴黎-萨克雷大学)

Serge Brosset, Daniel del Pozo Bueno, Thomas David, Laure Guetaz, Philippe Ciuciu, Zineb Saghi

AI总结:

提出无监督深度图像先验方法,在稀疏视角和有限角度条件下实现与监督方法相当的电子断层重建性能,并应用于实验数据验证其可靠性。

摘要:

电子断层扫描(ET)在纳米材料的三维(3D)表征中发挥着重要作用。然而,在有限角度和稀疏视角条件下,传统算法会产生退化的重建结果,影响所得3D数据的质量和可解释性。本文提出深度图像先验(DIP),一种无监督的深度学习(DL)方法,用于高度退化的断层扫描采集,并通过模拟数据证明,即使在倾斜范围仅为60°、倾斜步长为10°的情况下,其性能也与需要训练数据集的监督方法相当。然后,我们将其应用于实验数据,并表明它在稀疏视角和有限角度条件下都能实现可靠的3D量化,突显了其在广泛材料和采集模式中的潜力。

英文摘要:

Electron tomography (ET) plays an important role in the three-dimensional (3D) characterization of nanomaterials. However, under limited-angle and sparse-view conditions, conventional algorithms produce degraded reconstructions, which compromise the quality and interpretability of resulting 3D data. In this paper, we present deep image prior (DIP), an unsupervised deep learning (DL) approach, for highly degraded tomography acquisitions and demonstrate, using simulated data, that its performance is comparable to that of supervised approaches requiring training datasets, even for tilt ranges as limited as 60° and tilt increments of 10°. We then apply it to experimental data and show that it enables reliable 3D quantification under both sparse-view and limited-angle conditions, highlighting its potential for a wide range of materials and acquisition modalities.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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