Multi-wavelength digital holography enables surface-shape measurements with an exceptional dynamic range by combining interferometric resolution with synthetic wavelengths spanning multiple length scales. Although the concept promises measurement ranges of many orders of magnitude, its practical implementation is limited by the lack of light sources that allow fast, reliable, and calibration-free switching between synthetic wavelengths over a wide frequency range. Here, we present a synthetic-wavelength generator based on an electro-optic frequency comb with electronically tunable modulation frequency and a set of switchable band-pass filters. By combining discrete selection of comb-lines with continuous radio-frequency tuning, the proposed scheme merges the advantages of single-sideband modulation and filter-based comb extraction. Using only off-the-shelf components, the system provides synthetic frequencies from 0.1-220GHz, corresponding to synthetic wavelengths from meters down to millimeters in the visible. The generator achieves MHz-level frequency accuracy, side-mode suppression exceeding 40dB, and switching times below 25ms, even without active stabilization. We characterize the spectral purity and frequency agility of the source and demonstrate rapid tuning of synthetic wavelengths over 3 orders of magnitude. We apply the light source to multi-wavelength digital holography and reconstruct the surface of an industrially machined metal part featuring height variations from 0.1-100mm. The measurements achieve ten-mum-level precision using 7 single wavelengths covering synthetic wavelengths from 1.36mm to 1.874m within an acquisition time < 2s. The presented architecture combines high dynamic measurement range of 50dB, fast electronic reconfigurability, and intrinsic frequency calibration, making it a promising light source for high-speed interferometric surface metrology.
Nanometer-precision surface metrology of millimeter-size stepped objects using full-cascade-linked synthetic-wavelength digital holography using a line-by-line full-mode-extracted optical frequency comb
Compressed Sensing with off-axis frequency-shifting holography
Institut Pasteur, Unité d'Analyse d'Images Quantitative, CNRS URA 2582(巴斯德研究所,定量图像分析单元,法国国家科学研究中心 URA 2582);CNRS UMR 7587, INSERM U 979, UPMC, UP7, Fondation Pierre-Gilles de Gennes(法国国家科学研究中心 UMR 7587,法国国家健康与医学研究院 U 979,巴黎第六大学,UP7,皮埃尔-吉勒·德·热纳基金会);Institut Télécom, Télécom ParisTech, CNRS LTCI(巴黎电信学院,巴黎电信,法国国家科学研究中心 LTCI)