二维材料的自校正离轴全息术
Autocorrected Off-axis Holography of 2D Materials
摘要：
二维材料中的降维导致了大量不寻常的性质，这些性质目前正在基础科学和应用科学中进行探索。为了研究晶体结构、边缘状态、缺陷和晶界的形成，或吸附物的影响，高分辨率显微技术是必不可少的。在这里，我们报告的电子全息（EH）透射电子显微镜（TEM）技术，这有利于高空间分辨率的几何像差的自动校正的发展。EH超越传统TEM成像的显著特征是无间隙空间信息信号传输和某些空间频带的更高剂量效率以及直接访问2D材料的投影静电势。我们证明了这些功能的例子中的h-BN，在那里我们测量的静电势作为层数的函数下降到单层的限制，并获得证据的系统增加的潜在的锯齿形边缘。
英文摘要：
The reduced dimensionality in two-dimensional materials leads a wealth of unusual properties, which are currently explored for both fundamental and applied sciences. In order to study the crystal structure, edge states, the formation of defects and grain boundaries, or the impact of adsorbates, high resolution microscopy techniques are indispensible. Here we report on the development of an electron holography (EH) transmission electron microscopy (TEM) technique, which facilitates high spatial resolution by an automatic correction of geometric aberrations. Distinguished features of EH beyond conventional TEM imaging are the gap-free spatial information signal transfer and higher dose efficiency for certain spatial frequency bands as well as direct access to the projected electrostatic potential of the 2D material. We demonstrate these features at the example of h-BN, at which we measure the electrostatic potential as a function of layer number down to the monolayer limit and obtain evidence for a systematic increase of the potential at the zig-zag edges.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
