具有纳米级分辨率的magnetic induction场的高灵敏度测绘：离轴电子全息术和像素化微分相衬的比较
High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast
摘要：
我们比较了两种基于透射电子显微镜（TEM）的技术，可以提供高灵敏度的磁感应场的高度空间分辨的定量测量。为此，铁磁NiFe纳米线的磁感应强度已被测量和微磁建模相比。国家的最先进的电子全息已被执行使用的平均大系列的全息图，以提高测量的灵敏度。然后将这些结果与从像素化（或4D）扫描透射电子显微镜（STEM）获得的结果进行比较。这种新兴的技术使用像素化检测器，当光束在样品上扫描时，对局部衍射图案进行成像。对于每个衍射图案，测量光束的偏转并将其转换为磁感应，同时扫描光束可以构建地图。TEM和STEM的像差校正洛伦兹（无场）配置用于提高空间分辨率。我们表明，像素化的STEM方法，即使使用旧一代的电荷耦合器件相机进行，提供了更好的灵敏度在牺牲空间分辨率。给出了两种技术的更一般的比较。
英文摘要：
We compare two transmission electron microscopy (TEM) based techniques that can provide highly spatially resolved quantitative measurements of magnetic induction fields at high sensitivity. To this end, the magnetic induction of a ferromagnetic NiFe nanowire has been measured and compared to micromagnetic modelling. State-of-the-art electron holography has been performed using the averaging of large series of holograms to improve the sensitivity of the measurements. These results are then compared those obtained from pixelated (or 4D) scanning transmission electron microscopy (STEM). This emerging technique uses a pixelated detector to image the local diffraction patterns as the beam is scanned over the sample. For each diffraction pattern, the deflection of the beam is measured and converted into magnetic induction, while scanning the beam allows to build a map. Aberration corrected Lorentz (field-free) configurations of the TEM and STEM were used for an improved spatial resolution. We show that the pixelated STEM approach, even when performed using an old generation of charge-coupled device camera, provides better sensitivity at the expense of spatial resolution. A more general comparison of the two techniques is given.
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