在 Advanced Photon Source 使用 Transition Edge Sensor 测量的 X 射线发射线的受控位移
Controlled Shifts of X-ray Emission Lines Measured with Transition Edge Sensors at the Advanced Photon Source
AI总结：
提出利用同步辐射谐波弹性散射产生受控 eV 级线位移，并以固定荧光线在线校准，表征 TES 探测亚分辨率 X 射线能量位移的能力。
摘要：
测量 X 射线发射线的能量位移对于理解材料的电子结构和物理性质非常重要。在本研究中，我们展示了一种利用同步辐射源在固定能量荧光线之间引入窄线的受控 eV 量级位移的方法。我们使用该方法表征硬 X 射线超导 Transition Edge Sensor（TES，跃迁边传感器）阵列测量谱线位移的能力。由单色 X 射线束高次谐波激发的固定荧光线被用于在线能量校准，而来自主谐波的弹性散射则充当所研究的可变能量发射线。我们使用该方法证明了能够追踪幅度小于 TES 能量分辨率的弹性散射线能量位移，并发现最终受到校准过程的限制。该方法可应用于较宽的 X 射线能量范围，并为表征高分辨率探测器探测 X 射线发射线位移的能力以及定量比较能量校准过程提供了一种稳健方法。
英文摘要：
The measurement of shifts in the energy of X-ray emission lines is important for understanding the electronic structure and physical properties of materials. In this study, we demonstrate a method using a synchrotron source to introduce controlled eV-scale shifts of a narrow line in between fixed-energy fluorescence lines. We use this to characterize the ability of a hard X-ray superconducting Transition Edge Sensor (TES) array to measure line shifts. Fixed fluorescence lines excited by higher harmonics of the monochromatic X-ray beam are used for online energy calibration, while elastic scattering from the primary harmonic acts as the variable energy emission line under study. We use this method to demonstrate the ability to track shifts in the energy of the elastic scattering line of magnitude smaller than the TES energy resolution, and find we are ultimately limited by our calibration procedure. The method can be applied over a wide X-ray energy range and provides a robust approach for the characterization of the ability of high-resolution detectors to detect X-ray emission line shifts, and the quantitative comparison of energy calibration procedures.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
