arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2502.02435physics.ins-dethep-ex
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利用X射线辐照表征CMOS传感器

Characterization of CMOS sensor using X-ray irradiation

Anusree Vijay, Prafulla Kumar Behera, Theertha Chembakan, Ganapati Dash

AI总结:

本文针对未来高亮度对撞机实验需求,对新型单片像素探测器MALTA开展X射线辐照与电学表征研究,并通过不同厚度传感器的DAC对比分析揭示辐射影响与性能优化方向。

摘要:

粒子物理领域的最新进展要求像素探测器能够承受未来对撞机实验中不断提高的亮度。为此,一种新型单片有源像素探测器MALTA被开发出来,采用了前沿的读出架构。这类新型单片像素探测器被发现具有优异的抗辐射能力、更高的命中率、更高的分辨率以及精确的时间分辨率,使其非常适合在LHC实验中使用。为了在这些传感器部署到实际探测器之前优化其性能,已开展了全面的电学表征。本研究还包括对不同厚度传感器之间的DAC对比分析,为性能提升提供了关键见解。为了进一步理解辐射效应,这些传感器正在使用高强度X射线源接受不同通量的辐照。

英文摘要:

Recent advancements in particle physics demand pixel detectors that can withstand increased luminosity in the future collider experiments. In response, MALTA, a novel monolithic active pixel detector, has been developed with a cutting-edge readout architecture. This new class of monolithic pixel detectors is found to have exceptional radiation tolerance, superior hit rates, higher resolution and precise timing resolution, making them ideally suited for experiments at the LHC. To optimize the performance of these sensors before their deployment in actual detectors, comprehensive electrical characterization has been conducted. This study also includes comparative DAC analyses among sensors of varying thicknesses, providing crucial insights for performance enhancement. For the further understanding of the effect of radiation, the sensors are being exposed to different fluence using high intensity X-ray source.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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