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arXiv 2501.04431cond-mat.mtrl-sci
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利用矢量磁体同时进行 MOKE 成像和磁阻测量:用于低场磁性器件及薄膜表征的低噪声定制装置

Simultaneous MOKE imaging and measurement of magneto-resistance with vector magnet: a low noise customized setup for low field magnetic devices and thin films characterization

Imtiaz Noor Bhatti, Ilyas Noor Bhatti, L. G. Enger, P. Victor, B. Guillet, M. Lam Chok Sing, O. Rousseau, V. Pierron, S. Lebargy, J. Camarero, L. Mechin, S. Flament

AI总结:

本文研制了一套集成矢量磁体、MOKE 成像与低噪声磁阻测量的定制装置,可表征低场磁性薄膜与传感器,并通过 LSMO 器件验证了邻晶衬底诱导的单轴各向异性。

摘要:

本文报道了一套定制设计的装置,可在纵向配置下同时测量磁阻并进行 MOKE 成像,用于表征磁性薄膜和传感器。该装置旨在应对初始图像信噪比较低的问题,并实现在低场下高灵敏度的磁阻(MR)测量。装置采用改进的差分算法,以获得足够好的磁性图像对比度,并消除光束照明或相机微小增益波动的影响。为降低低频噪声以及热电噪声,还设计了自制电源和前置放大级。装置使用矢量磁体产生旋转磁场,以研究磁性薄膜中的磁各向异性并计算各向异性常数。利用该装置对在外延 La$_{0.67}$Sr$_{0.33}$MnO$_3$(LSMO)薄膜上图形化制备的磁阻传感器进行了表征。磁化反转过程的图像以及由这些图像推导出的局部磁化回线,证明了由邻晶衬底诱导的单轴磁各向异性。随后,根据 MR 测量结果推断出薄膜的磁各向异性常数。

英文摘要:

Here we report a custom design setup for the simultaneous measurement of magneto-resistance and MOKE imaging in longitudinal configuration for characterization of magnetic thin-films and sensors. The setup is designed so as to cope with a small signal to noise ratio of initial images and to allow sensitive magnetoresistance (MR) measurement at low field. An improved differential algorithm is used to get a good enough contrast of the magnetic images and get rid of beam illumination or small camera gain fluctuations. Home made power supply and pre-amplifier stage were designed so as to reduce the low frequency noise as well as the thermal electrical noise. A vector magnet is used to produce rotational magnetic field so as to study the magnetic anisotropy and calculate the anisotropic constants in magnetic thin films. Magnetoresistive sensors patterned on epitaxial La$_{0.67}$Sr$_{0.33}$MnO$_3$ (LSMO) thin film have been characterized with this setup. The Images of the magnetization reversal process as well as the local magnetization loops deduced from these images provided evidence of a magnetic uniaxial anisotropy induced by the vicinal substrate. The magnetic anistropic constant of the films was then inferred from the MR measurements.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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