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arXiv 2408.03315cond-mat.mes-hallquant-ph
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电子电荷穿梭的鲁棒性:架构、脉冲、电荷缺陷与噪声阈值

Robustness of electron charge shuttling: Architectures, pulses, charge defects and noise thresholds

Minjun Jeon, Simon C. Benjamin, Andrew J. Fisher

AI总结:

本文数值模拟了Si/SiO2器件的“传送带”电荷穿梭场景,发现仅需三个独立电极即可在脉冲缺陷、电荷缺陷和噪声下保持近乎完美的绝热性,证明其是提供半导体量子器件连接性的优秀方案。

摘要:

在基于半导体的量子技术中,在组件之间穿梭电荷的能力具有极大的应用前景。我们对简单的Si/SiO2器件的各种“传送带”穿梭场景进行了数值模拟,使用基于网格的分裂算符方法和时变二维势(来自Poisson求解器)显式建模了电子波函数。这使我们能够充分表征电子损失概率和激发分数。值得注意的是,仅需三个独立电极,该过程即使在存在脉冲不完美、附近电荷缺陷和Johnson-Nyquist噪声的情况下,仍能保持近乎完美的绝热性。只有高密度的电荷缺陷或位于“对抗性”位置的缺陷,才会灾难性地破坏电荷穿梭。虽然我们未显式建模自旋或谷自由度,但我们的电荷传播研究结果支持了传送带穿梭是提供半导体量子器件连接性的优秀候选方案的结论。

英文摘要:

In semiconductor-based quantum technologies, the capability to shuttle charges between components is profoundly enabling. We numerically simulated various "conveyor-belt" shuttling scenarios for simple Si/SiO2 devices, explicitly modelling the electron's wave function using grid-based split-operator methods and a time-dependent 2D potential (obtained from a Poisson solver). This allowed us to fully characterise the electron loss probability and excitation fraction. Remarkably, with as few as three independent electrodes the process can remain near-perfectly adiabatic even in the presence of pulse imperfection, nearby charge defects, and Johnson-Nyquist noise. Only a substantial density of charge defects, or defects at 'adversarial' locations, can catastrophically disrupt the charge shuttling. While we do not explicitly model the spin or valley degrees of freedom, our results from this charge propagation study support the conclusion that conveyor-belt shuttling is an excellent candidate for providing connectivity in semiconductor quantum devices.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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