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arXiv 2406.13614cond-mat.mtrl-sci
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超快电子显微镜中的相对飞行时间测量

Relative Time-of-Flight Measurement in an Ultrafast Electron Microscope

Jialiang Chen, Simon A. Willis, David J. Flannigan

AI总结:

本研究通过相干声子激发量化超快电子显微镜中不同光发射表面的相对飞行时间,发现Wehnelt孔径离轴取向导致数十皮秒的TOF偏移,为提升时空分辨率提供新方向。

摘要:

将飞秒(fs)激光驱动的超快电子显微镜(UEMs)的空间成像分辨率极限推向综合埃-秒(fs)范围的努力,将受益于能够产生高束团电荷的稳定源。近期展示的非传统离轴光发射几何结构具有前景,但与观察到的结构动力学起始之间的联系尚未建立。在这里,我们利用相干声子的原位光激发,量化从Ni Wehnelt孔径和从设置在孔径平面后方的Ta阴极产生的光电子包的的的相对飞行时间(r-TOF)。我们进一步通过精确电子枪架构和光发射几何结构的粒子追踪模拟来支持UEM实验。通过这种方式,我们测量了两种光发射表面电子包TOF的数十皮秒可辨别偏移。这些偏移源于Wehnelt孔径离轴取向对电子动量分布的影响,该影响相对于轴上发射修改了收集效率和时域包分布。我们识别了未来需求;我们预期UEM电子枪配置中的这一发展及其他发展将扩展可在与基本结构动力学相称的尺度上直接成像的材料现象范围。

英文摘要:

Efforts to push the spatiotemporal imaging-resolution limits of femtosecond (fs) laser-driven ultrafast electron microscopes (UEMs) to the combined angstrom-fs range will benefit from stable sources capable of generating high bunch charges. Recent demonstration of unconventional off-axis photoemitting geometries are promising, but connections to the observed onset of structural dynamics are yet to be established. Here we use the in-situ photoexcitation of coherent phonons to quantify the relative time-of-flight (r-TOF) of photoelectron packets generated from the Ni Wehnelt aperture and from a Ta cathode set-back from the aperture plane. We further support the UEM experiments with particle-tracing simulations of the precise electron-gun architecture and photoemitting geometries. In this way, we measure discernable shifts in electron-packet TOF of tens of picoseconds for the two photoemitting surfaces. These shifts arise from the impact the Wehnelt-aperture off-axis orientation has on the electron-momentum distribution, which modifies both the collection efficiency and the temporal-packet distribution relative to on-axis emission. Future needs are identified; we expect this and other developments in UEM electron-gun configuration to expand the range of materials phenomena that can be directly imaged on scales commensurate with fundamental structural dynamics.

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