HAXPES性能的突破结合了全视野k成像和飞行时间记录
Breakthrough in HAXPES Performance Combining Full-Field k-Imaging with Time-of-Flight Recording
摘要：
建立了一种新的硬X射线光电子能谱学（HAXPES）方法。仪器的关键特征是记录方案的维度从2D增加到3D。高能动量显微镜可以探测到初始动能大于6 keV的电子，具有< 0.1°的高角分辨率。特殊物镜的大k空间接受度允许同时对许多布里渊区进行全场成像。结合飞行时间并行能量记录，该方法产生最大的并行化的数据采集。在汉堡PETRA III的新光束线P22上进行的试验性实验中，在过渡金属的d带复合物中每秒超过$10^{6}$计数的计数率建立了前所未有的HAXPES记录速度。有人发现，层析k-空间映射的概念，以前证明在软X射线制度的工作同样好，在硬X射线范围。锐价带k-模式的Re收集在6 keV的激发能对应于直接跃迁到第28次重复布里渊区。鉴于高X射线亮度（在小于20 x 15 $mu^{2}$的光斑中为1.1 x $10^{13}$ hv/s），可以在几个小时内绘制3D体布里渊区。X射线光电子衍射（XPD）图的分辨率< 0.1°，可在数分钟内记录下来。衍射图中以前未观察到的精细细节反映了大量的散射体，根据能量的不同，有几个$10^{4}$到$10^{6}$。短的光电子波长（比原子间距离小一个数量级）放大了相位差，使具有高分辨率的硬X射线XPD成为非常灵敏的结构工具。高计数率为使用成像自旋滤波器的自旋分辨HAXPES铺平了道路。
英文摘要：
We established a new approach to hard-X-ray photoelectron spectroscopy (HAXPES). The instrumental key feature is an increase of the dimensionality of the recording scheme from 2D to 3D. A high-energy momentum microscope can detect electrons with initial kinetic energies more than 6 keV with high angular resolution < 0.1°. The large k-space acceptance of the special objective lens allows for simultaneous full-field imaging of many Brillouin zones. Combined with time-of-flight parallel energy recording, this method yields maximum parallelization of data acquisition. In a pilot experiment at the new beamline P22 at PETRA III, Hamburg, count rates of more than $10^{6}$ counts per second in the d-band complex of transition metals established an unprecedented HAXPES recording speed. It was found that the concept of tomographic k-space mapping previously demonstrated in the soft X-ray regime works equally well in the hard X-ray range. Sharp valence band k-patterns of Re collected at an excitation energy of 6 keV correspond to direct transitions to the 28th repeated Brillouin zone. Given the high X-ray brilliance (1.1x$10^{13}$ hv/s in a spot of less than 20x15 $mu^{2}$), the 3D bulk Brillouin zone can be mapped in a few hours. X-ray photoelectron diffraction (XPD) patterns with < 0.1° resolution are recorded within minutes. Previously unobserved fine details in the diffractograms reflect the large number of scatterers, several $10^{4}$ to $10^{6}$, depending on energy. The short photoelectron wavelength (an order of magnitude smaller than the interatomic distance) amplifies phase differences and makes hard X-ray XPD with high resolution a very sensitive structural tool. The high count rates pave the way towards spin-resolved HAXPES using an imaging spin filter.
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