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arXiv 2404.01565cond-mat.mtrl-sciphysics.app-ph
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采用四探针结构交流Harman法精确测定热电优值

Accurate determination of thermoelectric figure of merit using ac Harman method with a four-probe configuration

Kenjiro Okawa, Yasutaka. Amagai, Norihiko Sakamoto, Nobu-Hisa Kaneko

AI总结:

本研究针对四探针结构交流Harman法因热相位延迟难以准确测定热电优值zT的问题,通过求解热传导方程提出精确解,解释了反向热流误差来源与(Bi,Sb)$_2$Te$_3$的zT频率依赖特性,实现任意电压端子位置下的准确zT评估,为热电计量与材料搜寻提供工具。

摘要:

交流Harman法已被用于通过交/直流电阻测量直接估算无量纲热电优值(zT)。然而,由于低频电流下热流中会出现热相位延迟,采用四探针结构难以实现准确的zT估算。本研究通过求解热传导方程,提出了一种zT估算的精确解。该分析能够解释四探针结构中误差的主要来源——反向热流,也能解释实验测得的(Bi,Sb)$_2$Te$_3$的zT随频率变化的行为。若未选择合适的电流频率和电压端子位置,约20%的误差由热相位延迟导致。由此,本研究实现了在任意电压端子位置下采用四探针结构的准确zT评估。这些发现可推动热电计量学的发展,并可作为搜寻有潜力热电材料的有力工具。

英文摘要:

The ac Harman method has been used for the direct estimation of dimensionless thermoelectric figure of merit (zT) through ac/dc resistance measurements. However, accurate zT estimation with a four-probe configuration is difficult owing to the occurrence of a thermal phase-delay in the heat flow with a low frequency current. This study reports an exact solution for zT estimation by solving the heat conduction equation. The analysis can explain the reverse heat flow, which is the main source of the error in the four-probe configuration, and the experimentally obtained behavior of the frequency dependence of zT of (Bi,Sb)$_2$Te$_3$. Approximately 20 % of the error is caused by a thermal phase-delay, unless an appropriate current frequency and voltage-terminal position are chosen. Thus, an accurate zT evaluation using a four-probe configuration at any voltage terminal position is achieved. These findings can lead to interesting thermoelectric metrology and could serve as a powerful tool to search for promising thermoelectric materials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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