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arXiv 2402.14765cond-mat.mes-hall
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通过谷态反射测量实现实时电荷噪声测量的提议

Proposed real-time charge noise measurement via valley state reflectometry

David W. Kanaar, H. Ekmel Ercan, Mark F. Gyure, J. P. Kestner

AI总结:

针对硅量子点自旋量子比特逻辑操作中的电荷噪声,提出利用谷自由度与片上微波谐振腔耦合进行原位反射测量的方法,并证明可在1 ms内实现单位信噪比。

摘要:

我们从理论上提出一种在硅量子点自旋量子比特逻辑操作期间原位测量电荷噪声的方法。该方法不需要辅助的旁观量子比特,而是利用硅中的谷自由度。阱中尖锐的界面台阶或合金无序提供了谷跃迁偶极矩元,它与片上微波谐振腔的场耦合,从而能够快速反射测量由电荷噪声引起的谷分裂涨落。我们推导了可预期信噪比的解析表达式,并使用紧束缚模拟提取真实无序条件下的关键参数(谷分裂和谷偶极矩元)。我们发现,通常在低于1 ms的测量时间内即可获得单位信噪比,快于典型退相干时间,这为闭环控制、实时重新校准和前馈电路开辟了潜力。

英文摘要:

We theoretically propose a method to perform in situ measurements of charge noise during logical operations in silicon quantum dot spin qubits. Our method does not require ancillary spectator qubits but makes use of the valley degree of freedom in silicon. Sharp interface steps or alloy disorder in the well provide a valley transition dipole element that couples to the field of an on-chip microwave resonator, allowing rapid reflectometry of valley splitting fluctuations caused by charge noise. We derive analytic expressions for the signal-to-noise ratio that can be expected and use tight binding simulations to extract the key parameters (valley splitting and valley dipole elements) under realistic disorder. We find that unity signal-to-noise ratio can often be obtained with measurement times below 1ms, faster than typical decoherence times, opening the potential for closed-loop control, real-time recalibration, and feedforward circuits

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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