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arXiv 2402.05487physics.ins-det
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TAO实验中硅光电倍增管阵列批量测试装置的性能

Performance of the Mass Testing Setup for Arrays of Silicon Photomultipliers in the TAO Experiment

A. Rybnikov, N. Anfimov, M. Qu, A. Chetverikov, G. Cao, D. Fedoseev, H. Wang, V. Kozhukalov, V. Sharov, S. Sokolov, A. Sotnikov

AI总结:

本文介绍TAO实验中用于在-50C下批量表征4100个瓦片内约13万个SiPM的测试装置与方法,以实现1 MeV处2%的能量分辨率。

摘要:

现代中微子物理探测器通常采用数千甚至数十万个硅光电倍增管(SiPM)。TAO实验是一个典型的例子,它使用直径为1.8米的球形闪烁体桶,容纳约13万个SiPM,组织成4100个瓦片。每个尺寸为5x5cm^2的瓦片由32个SiPM阵列组成,作为一个探测器单元。为了在该体积内实现1 MeV处2%的卓越能量分辨率,SiPM必须具有尖端参数,包括光子探测效率(PDE)超过50%,串扰约10%,以及极低的暗计数率(DCR)低于50Hz/mm^2。将装置维持在-50C的负温度下是实现所需DCR的必要条件。本文介绍了在指定负温度下对全部4100个瓦片中的SiPM进行批量表征的装置和方法。

英文摘要:

Modern neutrino physics detectors often employ thousands, and sometimes even hundreds of thousands, of Silicon Photomultipliers (SiPMs). The TAO experiment is a notable example that utilizes a spherical scintillator barrel with a diameter of 1.8 meters, housing approximately 130,000 SiPMs organized into 4,100 tiles. Each tile with size of 5x5cm^2 consists of a 32-SiPM array functioning as a single detector unit. To achieve an unparalleled energy resolution of 2% at 1 MeV within this volume, the SiPMs must possess cutting-edge parameters, including a photon detection efficiency (PDE) exceeding 50%, cross-talk of approximately 10%, and an extremely low dark count rate (DCR) below 50Hz/mm^2. Maintaining the setup at a negative temperature of -50C is necessary to achieve the desired DCR. This article presents the setup and methods employed to individually characterize the mass of SiPMs across all 4,100 tiles at the specified negative temperature.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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