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arXiv 2309.09613cs.DS
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估计缺陷物品数量的Ω(log n)紧下界

A Tight Lower Bound of $Ω(\log n)$ for the Estimation of the Number of Defective Items

Nader H. Bshouty, Gergely Harcos

AI总结:

本文提出一种新方法证明非自适应随机群组测试中估计缺陷物品数量需要Ω(log n)次测试的紧下界,匹配已知上界并解决公开问题。

摘要:

设X为包含n个物品的集合,其中可能含有一些由I表示的缺陷物品,I ⊆ X。在群组测试中,一次测试指X的一个子集Q ⊂ X。若Q至少包含一个缺陷物品,即Q∩I ≠ ∅,则测试结果为1(阳性),否则为0(阴性)。我们提出一种获得非自适应随机群组测试紧下界的新方法。利用这一新方法,我们可以证明如下结果:任何非自适应随机算法,若对任意缺陷物品集合I,以至少2/3的概率返回对缺陷物品数量|I|的常数因子近似估计,则至少需要Ω(log n)次测试。我们的结果与O(log n)的上界相匹配,并解决了Damaschke和Sheikh Muhammad提出的公开问题。

英文摘要:

Let $X$ be a set of items of size $n$ , which may contain some defective items denoted by $I$, where $I \subseteq X$. In group testing, a {\it test} refers to a subset of items $Q \subset X$. The test outcome is $1$ (positive) if $Q$ contains at least one defective item, i.e., $Q\cap I \neq \emptyset$, and $0$ (negative) otherwise. We give a novel approach to obtaining tight lower bounds in non-adaptive randomized group testing. Employing this new method, we can prove the following result. Any non-adaptive randomized algorithm that, for any set of defective items $I$, with probability at least $2/3$, returns an estimate of the number of defective items $|I|$ to within a constant factor requires at least $Ω({\log n})$ tests. Our result matches the upper bound of $O(\log n)$ and solves the open problem posed by Damaschke and Sheikh Muhammad.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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