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arXiv 2304.04337physics.opticscond-mat.mtrl-sci
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金属悬臂在飞秒激光辐照下引起的机械形变探测

Detection of Mechanical Deformation Induced by Ultrafast Laser Irradiation upon a Metallic Cantilever

Takuto Ichikawa, Aizitiaili Abulikemu, Muneaki Hase

AI总结:

利用飞秒光泵浦-探测技术研究硅悬臂上铝薄膜,发现热膨胀引起的带间跃迁阈值变化主导了瞬态反射率信号的位置依赖性,为超快扫描探针显微技术应用提供新途径。

摘要:

本工作利用显微飞秒光泵浦-探测技术,系统研究了硅悬臂上铝薄膜的超快光学性质,以探索光辐照对悬臂的影响,同时考虑了辐射压和光热效应。研究所用的超快激光脉冲脉宽小于30 fs,波长为830 nm,其光子能量(1.49 eV)接近Al的带间跃迁阈值(ITT)。因此,通过以热化(Th)电子信号为主的瞬态反射率变化,检测到了由光辐照诱导的悬臂应变引起的ITT变化。我们揭示了100 nm厚Al薄膜在160 μm、200 μm和240 μm长悬臂上的瞬态反射率变化及Th电子信号幅值的位置依赖性,这些结果与基于双温模型的曲线拟合高度吻合。此外,为理解光辐照效应,我们推导了位置依赖的辐射压效应和光热效应方程,并证明热膨胀引起的ITT变化主导了信号强度的位置依赖性。本研究为探索应变对超快性质的影响及超快扫描探针显微技术的应用提供了新途径。

英文摘要:

In this work, we systematically investigated the ultrafast optical properties of aluminum (Al) thin films on silicon cantilevers using a microscopic femtosecond optical pump-probe technique to explore the effect of light irradiation upon cantilevers while considering radiation pressure and photothermal effects. The ultrafast laser pulses used for the study were less than 30 fs in pulse duration and 830 nm in wavelength, and the photon energy (1.49 eV) of the light pulses is close to the interband transition threshold (ITT) of Al. Therefore, the change in ITT due to the strain of the cantilevers induced by the light irradiation is detected through the change in the transient reflectivity, which is dominated by the thermalized (Th) electron signal. We uncovered the position dependency of the transient reflectivity change and the Th electronic signal amplitude of the 100 nm-thick Al films on 160 $μ$m, 200 $μ$m and 240 $μ$m-length cantilevers, and these results are in excellent agreement with two temperature model-based curve fits. Furthermore, to understand the effect of light irradiation, we derived equations for the position-dependent radiation pressure effect and the photothermal effect, and demonstrated that thermal expansion-induced changes in ITT dominate the position dependence of the signal intensity. Our findings offer avenues for exploring strain effects on ultrafast properties and applications for ultrafast scanning probe microscopy.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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