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arXiv 2303.04090quant-phcond-mat.mes-hall
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硅中高保真双比特门的误差变化评估

Assessment of error variation in high-fidelity two-qubit gates in silicon

Tuomo Tanttu, Wee Han Lim, Jonathan Y. Huang, Nard Dumoulin Stuyck, Will Gilbert, Rocky Y. Su, MengKe Feng, Jesus D. Cifuentes, Amanda E. Seedhouse, Stefan K. S… 展开作者

Tuomo Tanttu, Wee Han Lim, Jonathan Y. Huang, Nard Dumoulin Stuyck, Will Gilbert, Rocky Y. Su, MengKe Feng, Jesus D. Cifuentes, Amanda E. Seedhouse, Stefan K. Seritan, Corey I. Ostrove, Kenneth M. Rudinger, Ross C. C. Leon, Wister Huang, Christopher C. Escott, Kohei M. Itoh, Nikolay V. Abrosimov, Hans-Joachim Pohl, Michael L. W. Thewalt, Fay E. Hudson, Robin Blume-Kohout, Stephen D. Bartlett, Andrea Morello, Arne Laucht, Chih Hwan Yang, Andre Saraiva, Andrew S. Dzurak

AI总结:

研究硅SiMOS量子点平台双比特门误差的物理起源,通过三种表征方法测得96.8%至99.8%的纠缠门保真度,为可扩展高保真控制提供指导。

摘要:

持续实现高保真的量子比特纠缠操作对于多比特系统的性能至关重要,也是实现容错量子处理器的关键因素。固态平台尤其容易受到误差影响,因为材料会导致量子比特间存在变异性,从而引起性能不一致。在这里,我们研究了自旋量子比特处理器中的误差,并将其与物理起源联系起来。利用这些知识,我们在技术重要的硅金属-氧化物-半导体(SiMOS)量子点平台上,展示了保真度高于99%的双比特门的一致且可重复的操作。我们通过在多个设备上进行多次试验和长时间分析物理误差和保真度,对这些操作进行了详细研究,以确保捕捉到误差变化和最常见的误差类型。物理误差源包括单比特上的缓慢核噪声和电噪声以及上下文噪声。识别噪声源可用于将性能维持在容差范围内,并为未来的器件制造提供指导。此外,我们研究了量子比特设计、反馈系统和鲁棒门对实现可扩展、高保真控制策略的影响。这些结果是通过使用三种不同的表征方法获得的,我们测得纠缠门保真度范围为96.8%至99.8%。我们的分析工具识别了量子比特退化的原因,并提供了理解其物理机制的方法。这些结果突显了将硅自旋量子比特扩展为全尺寸量子处理器的能力与挑战。

英文摘要:

Achieving high-fidelity entangling operations between qubits consistently is essential for the performance of multi-qubit systems and is a crucial factor in achieving fault-tolerant quantum processors. Solid-state platforms are particularly exposed to errors due to materials-induced variability between qubits, which leads to performance inconsistencies. Here we study the errors in a spin qubit processor, tying them to their physical origins. We leverage this knowledge to demonstrate consistent and repeatable operation with above 99% fidelity of two-qubit gates in the technologically important silicon metal-oxide-semiconductor (SiMOS) quantum dot platform. We undertake a detailed study of these operations by analysing the physical errors and fidelities in multiple devices through numerous trials and extended periods to ensure that we capture the variation and the most common error types. Physical error sources include the slow nuclear and electrical noise on single qubits and contextual noise. The identification of the noise sources can be used to maintain performance within tolerance as well as inform future device fabrication. Furthermore, we investigate the impact of qubit design, feedback systems, and robust gates on implementing scalable, high-fidelity control strategies. These results are achieved by using three different characterization methods, we measure entangling gate fidelities ranging from 96.8% to 99.8%. Our analysis tools identify the causes of qubit degradation and offer ways understand their physical mechanisms. These results highlight both the capabilities and challenges for the scaling up of silicon spin-based qubits into full-scale quantum processors.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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