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arXiv 2302.12147cond-mat.mes-hall
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高迁移率 Corbino 环中的反常电子输运

Anomalous Electronic Transport in High Mobility Corbino Rings

Sujatha Vijayakrishnan, F. Poitevin, Oulin Yu, Z. Berkson-Korenberg, M. Petrescu, M. P Lilly, T. Szkopek, Kartiek Agarwal, K. W. West, L. N. Pfeiffer, G. Gervais

AI总结:

本文测量两种不同密度的超高迁移率 GaAs Corbino 样品,发现低温电阻非单调变化且密度依赖相反,并结合弹道、流体动力学输运及 Gurzhi 效应解释。

摘要:

我们报告了在两个多端 Corbino 样品中进行的低温电子输运测量,这些样品形成于 GaAs/Al-GaAs 二维电子气(2DEG)中,具有超高电子迁移率(≳20×10^6 cm²/Vs),且电子密度分别为 1.7 和 3.6×10^11 cm⁻²。在两个 Corbino 样品中,均观察到 1 K 以下电阻随温度变化的非单调行为。令人惊讶的是,在电子密度较低的样品中,电阻随温度升高而急剧下降,而在密度较高的样品中则观察到相反行为。为进一步研究,我们对具有相同异质结构的大型 van der Paauw 样品进行了输运测量,正如预期,它们表现出随温度单调变化的电阻率。最后,我们依据导致弹道和流体动力学电子输运的各种长度尺度,以及可能的 Gurzhi 效应,讨论了这些结果。

英文摘要:

We report low-temperature electronic transport measurements performed in two multi-terminal Corbino samples formed in GaAs/Al-GaAs two-dimensional electron gases (2DEG) with both ultra-high electron mobility ($\gtrsim 20\times 10^6$ $cm^2/Vs)$ and with distinct electron density of $1.7$ and $3.6\times 10^{11}~cm^{-2}$. In both Corbino samples, a non-monotonic behavior is observed in the temperature dependence of the resistance below 1~$K$. Surprisingly, a sharp {\it decrease} in resistance is observed with {\it increasing} temperature in the sample with lower electron density, whereas an opposite behavior is observed in the sample with higher density. To investigate further, transport measurements were performed in large van der Pauw samples having identical heterostructures, and as expected they exhibit resistivity that is monotonic with temperature. Finally, we discuss the results in terms of various lengthscales leading to ballistic and hydrodynamic electronic transport, as well as a possible Gurzhi effect.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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