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arXiv 2210.04780quant-phcond-mat.mes-hall
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背景电离辐射导致的超导量子比特中的 TLS 动力学

TLS Dynamics in a Superconducting Qubit Due to Background Ionizing Radiation

Ted Thorbeck, Andrew Eddins, Isaac Lauer, Douglas T. McClure, Malcolm Carroll

AI总结:

该研究在 27 量子比特处理器上利用 transmon 量子比特探测辐射与 TLS,发现辐射可引发“TLS 置乱”并导致寿命波动。

摘要:

超导量子比特的寿命必须既长又稳定,才能为量子计算提供充分基础。这种稳定性受到二能级系统(TLS)的威胁;TLS 目前是一种主要损耗机制,表现出缓慢的频谱动力学,使量子比特寿命在小时时间尺度上不稳定。在毫秒时间尺度上,稳定性同样受到威胁:近期发现电离辐射会引发相关的多量子比特衰减突发,从而使量子纠错更加复杂。在此,我们在一台 27 量子比特处理器上研究电离辐射与 TLS 动力学,将标准 transmon 量子比特改造为同时感知辐射撞击和 TLS 动力学的传感器。与以往文献不同,我们观察到量子比特寿命对辐射撞击产生的瞬态准粒子具有韧性。然而,我们也观察到这两个过程之间的一种新相互作用——“TLS 置乱”:一次辐射撞击会导致多个 TLS 的频率发生跳变;我们认为,这源于辐射撞击附近量子比特所感知到的同一种电荷重排。由于 TLS 置乱使 TLS 脱离或进入与量子比特的共振,量子比特寿命会相应增加或降低。因此,我们的发现确认辐射是量子比特寿命波动的一个新来源,并对表征和提升器件稳定性的工作具有启示意义。

英文摘要:

Superconducting qubit lifetimes must be both long and stable to provide an adequate foundation for quantum computing. This stability is imperiled by two-level systems (TLSs), currently a dominant loss mechanism, which exhibit slow spectral dynamics that destabilize qubit lifetimes on hour timescales. Stability is also threatened at millisecond timescales, where ionizing radiation has recently been found to cause bursts of correlated multi-qubit decays, complicating quantum error correction. Here we study both ionizing radiation and TLS dynamics on a 27-qubit processor, repurposing the standard transmon qubits as sensors of both radiation impacts and TLS dynamics. Unlike prior literature, we observe resilience of the qubit lifetimes to the transient quasiparticles generated by the impact of radiation. However, we also observe a new interaction between these two processes, "TLS scrambling," in which a radiation impact causes multiple TLSs to jump in frequency, which we suggest is due to the same charge rearrangement sensed by qubits near a radiation impact. As TLS scrambling brings TLSs out of or in to resonance with the qubit, the lifetime of the qubit increases or decreases. Our findings thus identify radiation as a new contribution to fluctuations in qubit lifetimes, with implications for efforts to characterize and improve device stability

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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