arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2209.08149physics.ins-dethep-ex
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薄膜带电粒子径迹探测器

Thin Film Charged Particle Trackers

Sungjoon Kim, Vikas Berry, Jessica Metcalfe, Anirudha V. Sumant

AI总结:

本文回顾硅径迹探测器的性能标准及薄膜半导体探测器研究,探讨利用薄膜制造技术实现大面积、低无效材料、低成本快速建造的未来粒子探测器所面临的关键问题与挑战。

摘要:

硅径迹探测器已经发展到覆盖数百平方米的更大表面积,甚至正在取代其他子探测器,例如量能器。然而,径迹探测器性能的进一步改进更有可能来自制造低质量探测器的能力,该探测器由高比例的有源传感器与无效材料组成,其中无效材料包括电气服务、冷却、机械支撑等。此外,目前建造这些探测器的成本和时间都很大。因此,径迹探测器基础技术的进步可能需要寻求一种更具变革性的方法,以实现极大的面积覆盖、最少的无效材料,并且更容易、更快地建造。薄膜制造技术的进步有可能彻底改变下一代之后的粒子探测器实验。一些薄膜沉积技术已经被开发出来并广泛应用于工业中,用于制造电视和显示器的LED屏幕。如果能够制造出几平方米量级的大面积薄膜探测器,其性能与当前硅技术相当,那么它们就可以用于未来的粒子物理实验。本文旨在回顾现有硅探测器的关键基本性能标准以及过去使用薄膜和其他半导体材料作为粒子探测器的研究,以探索追求薄膜探测器的重要考虑因素和挑战。

英文摘要:

Silicon tracking detectors have grown to cover larger surface areas up to hundreds of square meters, and are even taking over other sub-detectors, such as calorimeters. However, further improvements in tracking detector performance are more likely to arise from the ability to make a low mass detector comprised of a high ratio of active sensor to dead materials, where dead materials include electrical services, cooling, mechanical supports, etc. In addition, the cost and time to build these detectors is currently large. Therefore, advancements in the fundamental technology of tracking detectors may need to look at a more transformative approach that enables extremely large area coverage with minimal dead material and is easier and faster to build. The advancement of thin film fabrication techniques has the potential to revolutionize the next-to-next generation of particle detector experiments. Some thin film deposition techniques have already been developed and widely used in the industry to make LED screens for TV's and monitors. If large area thin film detectors on the order of several square meters can be fabricated with similar performance as current silicon technologies, they could be used in future particle physics experiments. This paper aims to review the key fundamental performance criteria of existing silicon detectors and past research to use thin films and other semi-conductor materials as particle detectors in order to explore the important considerations and challenges to pursue thin film detectors.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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