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arXiv 2205.13239cond-mat.mtrl-scicond-mat.otherphysics.app-phphysics.chem-ph
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从体相X射线衍射数据中确定高分辨率表面结构

High-resolution surface structure determination from bulk X-ray diffraction data

Nirman Chakraborty, Swastik Mondal

AI总结:

针对传统体相X射线衍射无法解析表面结构的问题,提出基于非球面电荷密度模型从体相XRD数据确定高分辨率表面电荷密度分布的方法,经碳化硼验证有效并发现表面结构与功能特性的关联。

摘要:

大多数表面现象的关键在于表面结构,尤其是表面上的电荷密度分布,它主要控制材料与外部环境的整体相互作用。人们普遍认为,传统体相X射线衍射数据无法解析表面结构。因此,当我们特别想要描绘表面结构时,技术上不得不采用表面敏感技术,如高能表面X射线衍射(HESXD)、低能电子衍射(LEED)、扫描透射电子显微镜(STEM)和掠入射小角X射线散射(GISAXS)。在这项工作中,我们使用不同分子和扩展固体中晶体结构的非球面电荷密度模型,展示了一种从传统体相X射线衍射(XRD)数据中确定高分辨率实验表面电荷密度分布的便捷且互补的方法。我们的方法的有效性已在碳化硼的表面功能上得到验证:碳化硼中的某些表面存在大量缺电子中心,而其他表面则不存在。由此,我们确定了计算出的表面结构与相应功能特性之间的合理关联。

英文摘要:

The key to most surface phenomenon lies with the surface structure. Particularly it is the charge density distribution over surface that primarily controls overall interaction of the material with external environment. It is generally accepted that surface structure cannot be deciphered from conventional bulk X-ray diffraction data. Thus, when we intend to delineate the surface structure in particular, we are technically compelled to resort to surface sensitive techniques like High Energy Surface X-ray Diffraction (HESXD), Low Energy Electron Diffraction (LEED), Scanning Transmission Electron Microscopy (STEM) and Grazing Incidence Small Angle X-ray Scattering (GISAXS). In this work, using aspherical charge density models of crystal structures in different molecular and extended solids, we show a convenient and complementary way of determining high-resolution experimental surface charge density distribution from conventional bulk X-ray diffraction (XRD) data. The usefulness of our method has been validated on surface functionality of boron carbide. While certain surfaces in boron carbide show presence of substantial electron deficient centers, it is absent in others. Henceforth, a plausible correlation between the calculated surface structures and corresponding functional property has been identified.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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