arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2202.08110cond-mat.supr-concond-mat.str-el
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Sr掺杂Bi2Se3薄膜的无序感生线性磁电阻

Disorder-induced linear magnetoresistance in Sr-doped Bi2Se3 thin films

Jiayuan Hu, Wenxiang Jiang, Guohua Wang, Yunlong Li, Jiangtao Wang, Jinlong Jiao, Qi Lu, Chenhang Xu, Wentao Zhang, Jie Ma, Dong Qian

摘要:

Sr掺杂的Bi_2Se_3薄膜是一种潜在的拓扑超导材料。在低磁场下,不同掺杂浓度x的SrxBi 2Se 3薄膜的磁电阻(MR)主要由弱反局域化(WAL)所控制,而原来占主导地位的经典MR几乎被完全抑制.相反,所有样品的MR已被观察到占主导地位的线性磁阻(LMR)在高磁场。LMR与载流子迁移率呈线性关系,可以用Parish-Littlewood模型成功地解释。这表明,LMR起源于由Sr掺杂原子在掺杂Bi_2Se_3薄膜中引起的迁移率波动。

英文摘要:

Sr-doped Bi2Se3 thin films was known as a potential candidate of topological superconductor. The magnetoresistance (MR) of SrxBi2Se3 films with various doping concentrations x were found to be dominated by weak antilocalization (WAL) at low magnetic fields, whereas the classical MR, which originally dominated the MR, was almost completely suppressed. In contrast, the MR of all samples has been observed to be dominated by linear magnetoresistance (LMR) at high magnetic fields. The LMR, having the linear dependence on carrier mobility, can be successfully explained by the Parish-Littlewood model. This indicates that LMR originates from mobility fluctuation induced by Sr dopant atoms in doped Bi2Se3 films.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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