arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2201.08973physics.ins-detnucl-ex
收藏

利用深度学习技术分析模拟的密集、完全耗尽的CCD暴露

Simulated Thick, Fully-Depleted CCD Exposures Analyzed with Deep Learning Techniques

C. Britt, E. Church, T. Hossbach, B. Loer, R. Saldanha, N. Sinha, K. Woodruff

摘要:

近来,厚的电荷耦合器件(CCD)已经被探索用于应用物理,诸如核爆炸监测和暗物质检测目的。当在完全耗尽模式下运行时,这些设备是各种初级粒子能量沉积的灵敏探测器。在本研究中,我们有兴趣将称为全景分割的深度学习(DL)技术应用于模拟CCD图像,以识别、归属和测量感兴趣的放射性同位素的能量沉积。我们模拟CCD曝光选定的放射性氙同位素,$^{135}$氙,并覆盖一个模拟的宇宙μ子背景适合的表面实验室。我们表明,与此DL技术,我们可以重现的β光谱,以良好的精度,同时遭受预期的混乱与相同的拓扑结构的伽马和转换电子和识别宇宙μ子低于最佳。

英文摘要:

Thick, Charge Coupled Devices (CCDs) have recently been explored for applied physics, such as nuclear explosion monitoring, and dark matter detection purposes. When run in fully-depleted mode, these devices are sensitive detectors for energy depositions by a variety of primary particles. In this study we are interested in applying the Deep Learning (DL) technique known as panoptic segmentation to simulated CCD images to identify, attribute and measure energy depositions from radioisotopes of interest. We simulate CCD exposures of a chosen radioxenon isotope, $^{135}$Xe, and overlay a simulated cosmic muon background appropriate for a surface-lab. We show that with this DL technique we can reproduce the beta spectrum to good accuracy, while suffering expected confusion with same-topology gammas and conversion electrons and identifying cosmic muons less than optimally.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑