利用部分耗尽Si探测器的数字信号进行能量测量和碎片识别
Energy measurement and fragment identification using digital signals from partially depleted Si detectors
摘要：
本文研究了利用欠耗尽剩余能量探测器的硅-硅DE-E望远镜的鉴别特性。已经使用了五种不同的偏置电压，一种对应于完全耗尽，其他与耗尽层范围从90%到60%的检测器厚度。已使用DE-E技术或脉冲形状分析（PSA）进行片段鉴定。两个探测器都是反向安装的：粒子从低场侧进入，以提高PSA性能。所实现的电荷和质量分辨率已使用品质因数（FoM）定量表示。电荷收集效率进行了评估，并已被认为是能量校准校正的可能性。我们发现，DE-E性能不受不完全耗尽，即使只有60%的晶圆耗尽。同位素分离能力在相对于完全耗尽的较低偏置电压下提高，尽管电荷识别阈值高于完全耗尽。部分耗尽探测器的掺杂均匀性不足以在完全耗尽时进行同位素鉴定，通过PSA获得了良好的同位素鉴定。
英文摘要：
A study of identification properties of a Si-Si DE-E telescope exploiting an underdepleted residual-energy detector has been performed. Five different bias voltages have been used, one corresponding to full depletion, the others associated with a depleted layer ranging from 90% to 60% of the detector thickness. Fragment identification has been performed using either the DE-E technique or Pulse Shape Analysis (PSA). Both detectors are reverse mounted: particles enter from the low field side, to enhance the PSA performance. The achieved charge and mass resolution has been quantitatively expressed using a Figure of Merit (FoM). Charge collection efficiency has been evaluated and the possibility of energy calibration corrections has been considered. We find that the DE-E performance is not affected by incomplete depletion even when only 60% of the wafer is depleted. Isotopic separation capability improves at lower bias voltages with respect to full depletion, though charge identification thresholds are higher than at full depletion. Good isotopic identification via PSA has been obtained from a partially depleted detector whose doping uniformity is not good enough for isotopic identification at full depletion.
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